SVS-Vistek SenSWIR Efficient & Economical
SWIR Inspection

Combine the potential of SWIR with the simplicity and robustness of conventional image processing. The new SenSWIR cameras allow efficient inspection and reliable quality Control.

One camera for SWIR and standard image

One camera for SWIR and standard image

The extended wavelength range of 400-1700 nm allows SWIR images and normal images to be captured almost simultaneously through the same camera. A time-consuming comparison of different viewing angles of SWIR image and VIS image is not necessary.

Low System invest

Low System invest

The SenSWIR sensors offer high resolution with little spatial footprint. The small, very light-sensitive pixel allows a very compact footprint of the camera and enables the use of small, low-cost c mount lenses. The GenTL interface enables rapid application development and significantly reduces system costs.

As simple as a GenICam industrial camera

As simple as a GenICam industrial camera

The SenSWIR EXO series and FXO series cameras are based on the mature industrial design of these industrial camera series with all the features you need. The SVS-Vistek toolkit and the GenTL interface enable quick integration into old and new applications, even with third-party software.

current camera models

Efficient and elegant inspection

Many materials show typical properties in the SWIR spectrum that allow clear substance identification. The wide wavelength range enables reliable identification and, in combination with the VIS range from the same perspective, simple implementation of the associated actions.

  • Detect moisture

    Water has typical characteristics in the SWIR range. Contamination with and from water as well as moisture content of e.g. fruits and vegetables can be identified.

    standard image of apples senSWIR image of apples showing moisture contents
  • Detect foreign substances

    Substances often exhibit typical reflection and transmission spectra in the SWIR range. This can be used to detect substance contaminations.

    standard image of substance samples senSWIR image of substance samples showing differenct materials
  • Use SWIR transparency

    Some materials such as silicon or some polymers are transparent in the SWIR range. This is used, for example, in the inspection of semi-finished products or enables inspection inside closed housings and packaging.

    standard image of samples senSWIR image of samples with SWIR transparency
  • Measure temperatures

    Hot objects are very bright in the SWIR range. This is used, for example, to estimate the temperature profile of welding seams.

    standard image of two soldering irons senSWIR image of two soldering irons showing temperatures

Typical inspection solutions with SWIR cameras

  • Icon Inspection of silicon and wafer quality
    Inspection of silicon and wafer quality (e.g. wafers, solar cells)
  • Icon Level measurement
    Level measurement for non-transparent containers
  • Icon Detect water/oil contamination
    Detect and quantify water presence.
    Detect water/oil contamination and leakage
  • Icon Substance determination
    Substance determination and detection of foreign material contamination (pharmaceutical, bulk material)
  • Icon agriculture status monitoring
    status monitoring in agriculture & food technology
  • Icon quality inspection of coatings
    Verification of lacquer finishes
    Quality inspection of coatings

Advantages of SVS-Vistek SenSWIR cameras

The new SenSWIR technology in SVS-Vistek SWIR cameras with Sony IMX990 / IMX991 sensors combines the robustness of a standard industrial camera with the possibilities offered by SWIR inspection. The small design and excellent image quality allow compact and economically attractive applications.

  • Extended wavelength spectrum 400-1700 nm offers a multitude of inspection possibilities
  • First-class quality and homogeneity (2-point NUC) of the image with high dynamic range
  • High quantum efficiency of almost 100% leads to high sensitivity
  • Small 5 µm pixels allow small camera footprint and low cost lenses
  • Design with minimal footprint facilitates integration into the application
  • Simultaneous inspection of VIS and SWIR from one perspective facilitates assignments
  • Integrated multichannel power strobe control for safe multispectral material identification
  • Proven industrial camera design with GenTL
  • With economical GigE Vision or fast CoaXPress-12 for highest inspection speeds

Resolutions and interfaces

Currently, 2 resolutions (0.3 MP and 1.3 MP) of the SVS-Vistek SWIR camera are available. Select between the economical GigE Vision interface and the fast CoaXPress-12 interface. We can deliver.

Current SVS-Vistek cameras with Sony SenSWIR sensor

fxo990MCX

fxo990MCX

  • 4 integrated LED-controllers
  • integrated sequencer
  • safe trigger technology
  • programmable logic control
  • CoaXPress-12
  • 134 fps
  • 1.3 MP
  • c mount
  • integrated multichannel strobe controller
  • GenICam interface
  • GenTL layer
» view camera
exo990MGE

exo990MGE

  • 4 integrated LED-controllers
  • integrated sequencer
  • safe trigger technology
  • programmable logic control
  • GigE Vision
  • 94 fps
  • 1.3 MP
  • c mount
  • integrated multichannel strobe controller
  • GenICam interface
  • GenTL layer
» view camera
exo991MGE

exo991MGE

  • 4 integrated LED-controllers
  • integrated sequencer
  • safe trigger technology
  • programmable logic control
  • GigE Vision
  • 260 fps
  • 0.3 MP
  • c mount
  • integrated multichannel strobe controller
  • GenICam interface
  • GenTL layer
» view camera

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